Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
Reexamination Certificate
2005-06-28
2005-06-28
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Signal generation or waveform shaping
C702S066000, C702S074000, C702S089000, C702S125000, C702S126000, C702S189000, C369S047350, C369S059210, C714S039000, C708S307000, C708S321000, C379S406150
Reexamination Certificate
active
06912474
ABSTRACT:
A method and apparatus for real-time derivation of precise digital clock edges and synchronous logic samples from a digital signal having a clock channel and at least one data channel acquires a plurality of temporally offset analog samples during each of a sequence of sample periods and from consecutive samples where there is a logic level transition estimates an edge time. From the edge times for the clock channel an offset is added and applied to the at least one data channel to determine the synchronous logic samples for the data channel at each offset clock edge time.
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Desta Elias
Gray Francis I.
Hoff Marc S.
Moser Patterson & Sheridan LLP
Tektronix Inc.
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