4. Data processing: measuring, calibrating, or testing
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Selective PARP-1 targeting for designing chemo/radio...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
Reexamination Certificate

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Selective resonance of chemical structures

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Biological or biochemical
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Self learning system and method for predicting remaining...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Self-contained steam trap monitor

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
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Self-diagnostic circuitry for emergency lighting fixtures

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Self-framing serial trigger for an oscilloscope or the like

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Self-learning reverse power flow detection

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Self-powered current monitor

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Self-processing integrated damage assessment sensor for...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
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Semblance processing for an acoustic...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science
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Semblance processing for an acoustic...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science
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Semiconductor device

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Semiconductor device and communications terminal and...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Semiconductor device having a test-voltage generation circuit

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Semiconductor having reduced configuration pins and method...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Semiconductor integrated circuit

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Semiconductor integrated circuit and information processing...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Semiconductor integrated circuit including...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Semiconductor integrated circuit, design support apparatus,...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Semiconductor module for outputting power loss

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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