Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-02-28
2006-02-28
Hoff, Marc S (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S064000, C702S080000
Reexamination Certificate
active
07006933
ABSTRACT:
A switching semiconductor device (11) provided in a semiconductor module (10) includes a plurality of switching semiconductor elements. A loss calculating section (12) calculates a power loss generated in the switching semiconductor device (11) based on a voltage of each of the switching semiconductor elements which is measured by a voltage measuring section (13) and a current of each of the switching semiconductor elements which is measured by a current measuring section (14). The loss calculating section (12) outputs loss data indicative of the power loss thus calculated as a data signal to a motor control section (82) provided on the outside of the semiconductor module (10). The motor control section (82) can recognize the power loss generated in the switching semiconductor device (11) from the loss data.
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Gutierrez Anthony
Hoff Marc S
Mitsubishi Denki & Kabushiki Kaisha
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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