Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-11-29
2005-11-29
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S105000, C365S149000, C365S194000, C365S189050
Reexamination Certificate
active
06970794
ABSTRACT:
A configurable semiconductor device having a plurality of predetermined configurations comprises a measurement circuit to measure an electrical characteristic of at least one external impedance and to determine a digital value corresponding to the measured electrical characteristic. A storage circuit includes memory locations having contents accessible as a function of the digital value. Each of the contents corresponds to a respective one of the predetermined configurations. A controller configures a device characteristic of the configurable semiconductor device based on the contents of the memory locations corresponding to the digital value.
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Marvell International Ltd.
Tsai Carol S. W.
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