Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

2008-01-17

2010-06-08

Tsai, Carol S (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S069000, C702S125000, C702S182000

Reexamination Certificate

active

07734433

ABSTRACT:
A semiconductor integrated circuit includes a first power source having a power supply voltage that operates the semiconductor integrated circuit, a voltage comparator that compares the power supply voltage with a reference voltage, and a comparison result recording unit that records a comparison result of the voltage comparator, wherein the comparison result recording unit records a length of a period based on a clock signal for which the power supply voltage exceeds the reference voltage.

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patent: 7304910 (2007-12-01), Hanzawa et al.
patent: 7355429 (2008-04-01), Jenkins et al.
patent: 7359811 (2008-04-01), Liu
patent: 7443187 (2008-10-01), Jenkins et al.
patent: 2002-091789 (2002-03-01), None
patent: 2004-212387 (2004-07-01), None

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