Semiconductor integrated circuit, design support apparatus,...

Details Semiconductor integrated circuit, design support apparatus,... Semiconductor integrated circuit, design support apparatus,...

2006-08-29

2006-08-29

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

Reexamination Certificate

active

07099783

ABSTRACT:
A semiconductor integrated circuit includes a self-testing circuit having a test circuit which is incorporated in a logic circuit to test the logic circuit. The test circuit has a test pattern generator to generate a test pattern and a compressor to compress a test result output. The logic circuit includes a plurality of scan chains including a plurality of serial connected registers and the compressor includes a through output portion. The semiconductor integrated circuit also includes a pattern counter which counts the test pattern at a test time of the logic circuit, a shift counter which counts the number of shifts in the scan chain in the logic circuit at the test time, and a failure information output circuit which is connected to the test circuit and which outputs step information of the test pattern corresponding to a failure to an integrated circuit external terminal when the failure is detected at the test time.

REFERENCES:
patent: 4000460 (1976-12-01), Kadakia et al.
patent: 5138619 (1992-08-01), Fasang et al.
patent: 5-87888 (1993-04-01), None
patent: 6-51022 (1994-02-01), None
patent: 11-202026 (1999-07-01), None

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