Semiconductor integrated circuit including...

Details Semiconductor integrated circuit including... Semiconductor integrated circuit including...

2005-07-05

2005-07-05

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

Reexamination Certificate

active

06915222

ABSTRACT:
A semiconductor integrated circuit according to an aspect of the invention comprises a first storage circuit, second storage circuit, adder circuit, timer, first comparator circuit and waveform-generating circuit. The first storage circuit stores a first value used to set a dead time. The second storage circuit stores a second value used to set a pulse width. The adder circuit adds the first value stored in the first storage circuit and the second value stored in the second storage circuit, thereby outputting an addition result. The timer measures an elapsed time and outputs a count value indicative of the elapsed time. The first comparator circuit compares the count value output from the timer with the addition result output from the adder circuit. The waveform-generating circuit generates a pulse on the basis of a comparison result of the first comparator circuit.

REFERENCES:
patent: 3793635 (1974-02-01), Potter
patent: 5223656 (1993-06-01), Higashi
patent: 5515258 (1996-05-01), Viertler
patent: 5930132 (1999-07-01), Watanabe et al.

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