Semiconductor integrated circuit and information processing...

Details Semiconductor integrated circuit and information processing... Semiconductor integrated circuit and information processing...

2008-05-29

2010-02-23

Feliciano, Eliseo Ramos (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S078000, C702S081000, C702S082000

Reexamination Certificate

active

07668675

ABSTRACT:
In a semiconductor integrated circuit, a counter counts the number of high-speed clock signals that have been generated in a predetermined number of clock cycles of a low-speed clock signal. In synchronization with the low-speed clock signal, the semiconductor integrated circuit compares the counter value and a predetermined value, and judges whether the frequency of the high-speed clock signal has reaches a predetermined frequency. Since variations in the frequency become smaller as the oscillation of a high-speed oscillator stabilizes, the semiconductor integrated circuit detects that the oscillation is stable when the semiconductor integrated circuit has judged affirmatively a plurality of times.

REFERENCES:
patent: 6675311 (2004-01-01), Hotta et al.
patent: 6754840 (2004-06-01), Poisner
patent: 7065668 (2006-06-01), Kosuda et al.
patent: 7467307 (2008-12-01), Kano
patent: 3-95606 (1991-04-01), None

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