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Method for measuring dead time of X-ray detector

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Method for measuring Fe coating weight of Fe-coated stainless st

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Method for measuring powder x-ray diffraction data using...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for measuring speed and high resolution information...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for measuring the wall thickness of a tubular object

X-ray or gamma ray systems or devices – Specific application – Absorption
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Method for microbeam radiation therapy

X-ray or gamma ray systems or devices – Specific application – Absorption
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Method for minimizing image artifacts and medical imaging...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for minimizing image artifacts and medical imaging...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for minimizing the tongue and groove effect in...

X-ray or gamma ray systems or devices – Specific application – Absorption
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Method for monitoring the crystallographic texture of metallic t

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for obtaining a picture of the internal structure of...

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Method for obtaining optimized computed tomography images from a

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for obtaining the image of the internal structure of an o

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for obtaining the image of the internal structure of an o

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for operating a computed tomography (CT) device

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for operating a computed tomography apparatus

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for operating a computed tomography apparatus

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for operating a medical X-ray machine utilizing plural X-

X-ray or gamma ray systems or devices – Specific application – Absorption
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Method for operating a primary beam stop

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for operating an image system of an imaging medical...

X-ray or gamma ray systems or devices – Specific application – Absorption
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