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Scanning probe microscopy cantilever, corresponding...

Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their... – Probe characteristics
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Scanning system for optical transmitter beams

Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their... – Probe tip arrays
Patent

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Short and thin silicon cantilever with tip and fabrication...

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Atomic force microscopy or apparatus therefor – e.g. – afm probes
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Smart materials: strain sensing and stress determination by...

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;...
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Spin-torque probe microscope

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Multiple-type spm – i.e. – involving two or more spm techniques
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SPM probe with shortened cantilever

Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their... – Probe holders
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Substrate patterning by electron emission-induced displacement

Scanning-probe techniques or apparatus; applications of scanning – Scanning or positioning arrangements – i.e. – arrangements for...
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Tip array structure and fabricating method of tip structure

Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their... – Probe manufacture
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