4. Optics: measuring and testing
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Extended range interferometric refractometer

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Extended range monochromator

Optics: measuring and testing – By dispersed light spectroscopy – With monochromator structure
Patent

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Extended surface parallel coating inspection method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Extended wavelength calibration reference

Optics: measuring and testing – Standard
Reexamination Certificate

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Extended-range two-color interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Extended-source low coherence interferometer for flatness testin

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Extending RLG lifetime by maintaining low level oxygen...

Optics: measuring and testing – By light interference – Rotation rate
Reexamination Certificate

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Exterior view inspecting apparatus for circuit board

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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External calibration system for a photo multiplier tube

Optics: measuring and testing – Photometers – Comparison
Patent

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External cavity diode laser sensor

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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External lead shape measurement apparatus for measuring lead sha

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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External scatter removal system

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Extinction type detector

Optics: measuring and testing – For light transmission or absorption – Of fluent material
Patent

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Extracted polarization intensity differential scattering for...

Optics: measuring and testing – For size of particles – By particle light scattering
Reexamination Certificate

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Extraction of tool independent line-edge-roughness (LER)...

Optics: measuring and testing – Dimension
Reexamination Certificate

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Extraneous substance inspection apparatus for patterned wafer

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Extraneous substance inspection apparatus for patterned wafer

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Extraneous substance inspection method and apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Extrinsic fiber optic displacement sensors and displacement sens

Optics: measuring and testing – Material strain analysis – By light interference detector
Patent

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Extruded wobble plate optical alignment device

Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Patent

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