Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2006-03-21
2006-03-21
Stafira, Michael P. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
C356S237500, C356S630000
Reexamination Certificate
active
07016030
ABSTRACT:
Techniques for rapidly characterizing reflective surfaces and especially multi-layer EUV reflective surfaces of optical components involve illuminating the entire reflective surface instantaneously and detecting the image far field. The technique provides a mapping of points on the reflective surface to corresponding points on a detector, e.g., CCD. This obviates the need to scan a probe over the entire surface of the optical component. The reflective surface can be flat, convex, or concave.
REFERENCES:
patent: 5091650 (1992-02-01), Uchida et al.
patent: 5438879 (1995-08-01), Reda
patent: 5958605 (1999-09-01), Montcalm et al.
patent: 6097483 (2000-08-01), Komatsu
patent: 6211525 (2001-04-01), Cowham
patent: 6218671 (2001-04-01), Gordon et al.
patent: 6392792 (2002-05-01), Naulleau
patent: 6399957 (2002-06-01), Murata
patent: 6525829 (2003-02-01), Powell et al.
patent: 6555828 (2003-04-01), Bokor et al.
patent: 6650421 (2003-11-01), Magome
patent: 2003/0067598 (2003-04-01), Tomie
Cascio Schmoyer & Zervas
EUV LLC
Stafira Michael P.
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