Search
Selected: M

Method and apparatus for analyzing nodal interference patterns v

Optics: measuring and testing – Material strain analysis – By light interference detector
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for examining test pieces

Optics: measuring and testing – Material strain analysis – By light interference detector
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for inspecting or testing a sample by optic

Optics: measuring and testing – Material strain analysis – By light interference detector
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for measuring deformation of a workpiece su

Optics: measuring and testing – Material strain analysis – By light interference detector
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for nondestructive testing of the mechanica

Optics: measuring and testing – Material strain analysis – By light interference detector
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for real-time speckle interferometry for st

Optics: measuring and testing – Material strain analysis – By light interference detector
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for sensing in-plane deformation of a surfa

Optics: measuring and testing – Material strain analysis – By light interference detector
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for sensing ultrasonic energy

Optics: measuring and testing – Material strain analysis – By light interference detector
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for testing electrical connectors

Optics: measuring and testing – Material strain analysis – By light interference detector
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for viewing a shearographic image

Optics: measuring and testing – Material strain analysis – By light interference detector
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and device for measuring stresses of membranes in a...

Optics: measuring and testing – Material strain analysis – By light interference detector
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method for dynamic interference pattern testing

Optics: measuring and testing – Material strain analysis – By light interference detector
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method for increasing the signal-to-noise ratio in...

Optics: measuring and testing – Material strain analysis – By light interference detector
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method for measuring a thermal expansion coefficient of a...

Optics: measuring and testing – Material strain analysis – By light interference detector
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method for measuring residual stresses in materials by plastical

Optics: measuring and testing – Material strain analysis – By light interference detector
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method for non-destructive inspection of an aircraft

Optics: measuring and testing – Material strain analysis – By light interference detector
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method for resolving phase in electronic speckle interferometry

Optics: measuring and testing – Material strain analysis – By light interference detector
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method for whole field thin film stress evaluation

Optics: measuring and testing – Material strain analysis – By light interference detector
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method of creating holographic interferograms for structural exa

Optics: measuring and testing – Material strain analysis – By light interference detector
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method of determining structural features of test pieces...

Optics: measuring and testing – Material strain analysis – By light interference detector
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.