Method and apparatus for analyzing nodal interference patterns v

Details Method and apparatus for analyzing nodal interference patterns v Method and apparatus for analyzing nodal interference patterns v

1993-08-17

1995-04-18

Turner, Samuel A.

Optics: measuring and testing

Material strain analysis

By light interference detector

73800, 356347, G01L 124

Patent

active

054083052

ABSTRACT:
Methods and apparatus for automatically analyzing anti-nodal patterns formed in the outer skin of a semi-monocoque structure when it is excited to vibrate at a resonant frequency at which out-of-plane displacement is optimized. The described principles of analysis may be utilized to analyze a recorded image of the anti-nodal patterns obtained by holographic interferometry, or to directly examine the anti-nodal pattern by scanning a test area of the surface with a beam of coherent radiation, e.g., a laser beam, and utilizing the Doppler effect, measuring, recording and displaying a contour map showing out-of-plane displacement of the surface for analysis. In the holographic record case, comparison of the fringe density of the anti-nodes against the density of any fringes which may occur along normally fringe-free lines of underlying structure reveals the type and location of any structural faults. In the laser Doppler system, faults are identified by comparing the surface displacement of the anti-nodes with any displacements occurring along lines of the underlying structure.

REFERENCES:
patent: 3911733 (1975-10-01), Bhuta et al.
patent: 4248093 (1981-02-01), Andersson et al.
patent: 5065331 (1991-11-01), Vachon et al.

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