Optics: measuring and testing – Material strain analysis – By light interference detector
Patent
1993-07-13
1995-07-11
Turner, Samuel A.
Optics: measuring and testing
Material strain analysis
By light interference detector
356357, 356432, 73800, G01B 902
Patent
active
054325951
ABSTRACT:
A method for measuring residual stress in a material comprising the steps of establishing a speckle pattern on the surface with a first laser then heating a portion of that pattern with an infrared laser until the surface plastically deforms. Comparing the speckle patterns before and after deformation by subtracting one pattern from the other will produce a fringe pattern that serves as a visual and quantitative indication of the degree to which the plasticized surface responded to the stress dung heating and enables calculation of the stress.
REFERENCES:
patent: 4139302 (1979-02-01), Hung et al.
patent: 4248094 (1981-02-01), Thompson et al.
patent: 4249423 (1981-02-01), Viertl et al.
patent: 4522510 (1985-06-01), Rosencwaig et al.
patent: 4722600 (1988-02-01), Chiang
patent: 5166742 (1992-11-01), Kobayashi et al.
"Measurement of Strains at High Temperatures by Means of Electro-Optics Holography", Sciammarella, et al, Jun. 1991.
Dixon Harold M.
Moser William R.
Tumm Brian R.
Turner Samuel A.
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