Method for resolving phase in electronic speckle interferometry

Details Method for resolving phase in electronic speckle interferometry Method for resolving phase in electronic speckle interferometry

2007-10-09

2007-10-09

Bruce, David (Department: 2876)

Optics: measuring and testing

Material strain analysis

By light interference detector

C356S512000, C356S521000

Reexamination Certificate

active

11248856

ABSTRACT:
The invention is a method of determining the phase difference between two interferometric images. The method includes the steps of measuring the intensities of the two beam arms, and measuring the intensities of the interfering beam arms at two different times (two frames). From the recorded data, the phase angle between the arms can be determined for each frame. These frame phase angles subtracted, and the sine of the difference is taken. The resulting data set is examined to determine a multiplicative factor that converts the minimum and maximum to the bounds of the sine function (−1, +1). This multiplicative factor is applied to a bounded trig function of the difference of the frame angles, and the inverse of the bounded trig function is taken, resulting in the phase difference between frames.

REFERENCES:
patent: 4225240 (1980-09-01), Balasubramanian
patent: 5004345 (1991-04-01), Hung
patent: 5666197 (1997-09-01), Guerra
patent: 6717680 (2004-04-01), Kuchel et al.
patent: 2004/0057054 (2004-03-01), Toyooka et al.
S. Yoshida, Suprapedi, R. Widiastuti, E. Tri Astuti and A. Kusnowo, Phase evaluation for electronic speckle-pattern interferometry deformation analysis, Optics Letters, 1995, 755-757, vol. 20, No. 7.
S. Yoshida, Suprapedi, R. Widiastuti, E. Tri Astuti and A. Kusnowo, Phase evaluation for electronic speckle-pattern interferometry deformation analyses, Optics Letters, 1995, 755-757, vol. 20, No. 7.

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