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In-situ source metrology instrument and method of use

Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate

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In-situ source metrology instrument and method of use

Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate

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Intensity distribution simulating method

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Irradiance analyzer for high power lasers

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Large area energy beam intensity profiler

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Large dynamic range Shack-Hartmann wavefront sensor

Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate

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Laser beam analyzer

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Laser beam analyzer

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Laser beam multimeter

Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate

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Light destribution of headlight beam

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Light distribution of headlight beam

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Light intensity distribution measuring method and light...

Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate

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Linear-scanned-array wavefront sensor

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Machine and method for measuring a characteristic of an...

Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate

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Measuring apparatus for adjusting optical axis of headlight and

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Measuring device using optical beam

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Measuring method of illuminance unevenness of exposure...

Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate

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Method and apparatus for aerial image analyzer

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Method and apparatus for detecting a focussing condition of an o

Optics: measuring and testing – Lamp beam direction or pattern – With lamp focusing
Patent

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Method and apparatus for detecting positions of light...

Optics: measuring and testing – Lamp beam direction or pattern
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