Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate
2007-01-08
2011-12-06
Punnoose, Roy M (Department: 2886)
Optics: measuring and testing
Lamp beam direction or pattern
Reexamination Certificate
active
08072587
ABSTRACT:
A machine and methods measure a characteristic of an optical signal incident upon a detector characterized by one or more dynamic response parameters. One method receives an output signal from the detector and compares that output signal and a computationally determined response of the detector to a known optical signal incident upon the detector. The response is based on said one or more dynamic parameters. The method determines the characteristic based on a relationship between the output signal and the computationally determined response. Another method observes an output signal from an optical detector detecting one or more optical signals, accesses a characteristic curve of detector response, compares the observed output signal to the characteristic curve, and calculates at least one characteristic of one or more optical signals based on a relationship of the observed output signal and the characteristic curve.
REFERENCES:
patent: 3761185 (1973-09-01), Blackwell
patent: 4469943 (1984-09-01), Turnbull
patent: 4526470 (1985-07-01), Kaye
patent: 5267013 (1993-11-01), Spence
patent: 5513029 (1996-04-01), Roberts
patent: 5909278 (1999-06-01), Deka et al.
patent: 6426497 (2002-07-01), Martinez et al.
patent: 6541754 (2003-04-01), Matsuyama
patent: 6653613 (2003-11-01), Bucourt et al.
patent: 6704920 (2004-03-01), Brill et al.
patent: 7002131 (2006-02-01), Lewis
patent: 7102738 (2006-09-01), Matsuura et al.
patent: 7164131 (2007-01-01), Phelan, Jr.
patent: 2002/0014886 (2002-02-01), Matsuyama
patent: 2002/0030153 (2002-03-01), Matsuyama
patent: 2003/0127588 (2003-07-01), Martinez
patent: 2004/0039377 (2004-02-01), Feige et al.
patent: 2006/0266943 (2006-11-01), Phelan
patent: WO 98/50767 (1998-11-01), None
Oppenheim, Alan V., Willsky, Alan S., “Signals and Systems”, 1983, 4 pages, Prentic-Hall, Inc., Englewood Cliffs, New Jersey 07632.
International Search Report, W098/50767, issued Jun. 22, 2007.
European Patent Office, Supplementary European Search Report, EP App. No. 07710380.6, Oct. 12, 2010, 7 pages.
Bryant P. et al., Advanced Test and Calibration Systems for Integrated Multisensor Platforms with Infrared, Visible, and Laser Range Finder/Designator Capabilities, Proc. of SPIE vol. 5076, Oct. 16, 2003, pp. 233-241.
National Institute of Standards and Technology, Optical Radiation Measurements, Mar. 13, 2005, 8 pages.
International Searching Authority, International Patent Application No. PCT/US2007/000314, International Search Report and Written Opinion, Jun. 22, 2007, 7 pages.
Kasturi Prakash
Nastase Adrian
Newport Corporation
Punnoose Roy M
Stoel Rives LLP
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