Optics: measuring and testing – Lamp beam direction or pattern
Patent
1995-09-21
1997-12-02
Pham, Hoa Q.
Optics: measuring and testing
Lamp beam direction or pattern
356218, 25022731, G01J 142
Patent
active
056942095
ABSTRACT:
A device for sampling a section of a laser beam using an elongated reflective element that is moved in a main direction that corresponds to the direction of elongation of the element and in a direction perpendicular to the main direction. This sampling device forms a part of a laser beam analyzer and provides a small reflected beam segment to the analyzer that corresponding to the part of the laser beam that impinges upon the moving elongated reflecting element.
REFERENCES:
patent: 2812685 (1957-11-01), Vossberg
patent: 3731106 (1973-05-01), Mansell
patent: 4035088 (1977-07-01), Jenkins et al.
patent: 4260255 (1981-04-01), Wachs et al.
patent: 5453828 (1995-09-01), Holt
patent: 5463215 (1995-10-01), Alfille
JP-A-63 033 637, Feb. 13, 1988.
Alfille Jean-Pascal
Raoux Jean
Commissariat a l''Energie Atomique
Pham Hoa Q.
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