Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate
2006-08-15
2006-08-15
Toetley, Jr., Gregory J (Department: 2877)
Optics: measuring and testing
Lamp beam direction or pattern
Reexamination Certificate
active
07092080
ABSTRACT:
A light intensity distribution measuring method for measuring the light intensity distribution of a laser beam emitted by a semiconductor laser comprises the steps of measuring light intensities at a plurality of locations in a laser beam emitted by a semiconductor laser and applying their measurement results to a t distribution function to calculate the light intensity distribution. A light intensity distribution measuring device is also described.
REFERENCES:
patent: 3612885 (1971-10-01), Arnaud
patent: 3617755 (1971-11-01), Arnaud
patent: 4320462 (1982-03-01), Lund et al.
patent: 5214485 (1993-05-01), Sasnett et al.
Akanbi Isiaka O.
NIDEC Sankyo Corporation
Reed Smith LLP
Toetley, Jr. Gregory J
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