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Inspection apparatus for surfaces of spheres

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Inspection apparatus having two sensors, method for...

Optics: measuring and testing – Inspection of flaws or impurities
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Inspection apparatus with refractor for illuminating can flange

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Patent

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Inspection apparatus, inspection method, and manufacturing...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection booth for substrates coated with a thin film

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
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Inspection device

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
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Inspection device and inspection method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection device and inspection method for pattern profile,...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection device and method for inspecting coated...

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
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Inspection device for crystal defect of silicon wafer and...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection device for inspecting container closures

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
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Inspection device for transparent substrate end surface and...

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
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Inspection head supporting structure in surface inspecting...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection lighting head system and method of operation

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection lighting system

Optics: measuring and testing – Inspection of flaws or impurities – Textile inspection
Patent

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Inspection method and apparatus for detecting defects on...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection method and apparatus lithographic apparatus,...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection method and apparatus using same

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection method and device of wafer surface

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Patent

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Inspection method and inspection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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