Optics: measuring and testing – Inspection of flaws or impurities – Textile inspection
Patent
1982-09-30
1985-08-06
McGraw, Vincent P.
Optics: measuring and testing
Inspection of flaws or impurities
Textile inspection
356430, 356446, 26 70, G01N 2147, G01N 2188
Patent
active
045332452
ABSTRACT:
A method and apparatus for inspecting substrates such as flat textile fabrics which have been sculptured to a depth of less than about 0.003 inches. Opposing line sources of illumination are used to illuminate the substrate at a relatively low angle while the substrate is held flat in front of a dark, non-reflective background and is substantially shielded from ambient light.
REFERENCES:
patent: 2059308 (1934-02-01), Boadwee et al.
patent: 3524988 (1967-11-01), Gaither, IV
patent: 3574469 (1971-04-01), Emerson
patent: 3877814 (1975-04-01), Hess et al.
patent: 3992111 (1976-11-01), Roulier et al.
patent: 4065213 (1977-12-01), Nyman
Fisher George M.
McGraw Vincent P.
Milliken Research Corporation
Petry H. William
Turner S. A.
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