Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate
2007-10-30
2007-10-30
Pham, Hoa Q. (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
Reexamination Certificate
active
10547827
ABSTRACT:
An inspection apparatus for inspecting an end face of a transparent substrate and an inspection method for inspecting an end face of a transparent substrate according to the present invention are capable of reliably and accurately detecting defects at the end face of the transparent substrate. When a display panel substrate10which is a transparent substrate to placed on a rotating table21, a light is intermittently emitted from an end-face illuminating unit39arranged opposite to the end face of the display panel substrate10. The light emitted along the surface of the substrate10is reflected from a lower reflecting mirror42toward the end face of the transparent substrate10. The end face and an adjacent portion thereof are imaged by a CCD camera36. Defects at the end face of the display panel substrate10are detected based on an image density of each pixel in the obtained image data.
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Mitsuboshi Diamond Industrial Co., Ltd.
Pham Hoa Q.
Renner , Otto, Boisselle & Sklar, LLP
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