Search
Selected: I

Inspection system with in-lens, off-axis illuminator

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system with multiple illumination sources

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection systems and methods

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection systems and methods for extending the detection...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection systems for glass sheets

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection systems having rotating motion

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection systems performing two-dimensional imaging with...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection systems using sensor array and double threshold...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection systems using sensor array and double threshold...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection systems using sensor array and double threshold...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection tool

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection tools supporting multiple operating states for...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Instrument for selecting and depositing multicellular...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Instrument for selecting and depositing multicellular...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Instrument for working the surfaces of parts inside engineered c

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Integral field lens illumination for video inspection

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Integrated circuit defect review and classification process

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Integrated circuit defect review and classification process

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Integrated circuit defect review and classification process

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Integrated circuit defect review and classification process

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.