4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  Search
Selected: I
All A B C D E F G H
I
J K L M N O P Q R S T U V W X Y Z 0 1 2 3 4 5 6 7 8 9 ! " $ ' ( ) * , - / : < = > ? @ [ \ ] ^ ` { | } ~ €

Inspection of transparent substrates for defects

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection of transparent substrates for defects

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection station

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system and a method for aerial reticle inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system and device manufacturing method using the same

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system and method

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system and method

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system and method

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system and method

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system and method for leads of semiconductor devices

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system employing illumination that is selectable...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system for detecting surface flaws

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system for edges of glass

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system for integrated applications

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system for limited access spaces

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system for limited access spaces

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system for sheet material

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system simultaneously utilizing monochromatic darkfie

Optics: measuring and testing – Inspection of flaws or impurities
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system utilizing dark-field illumination

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection system with enhanced contrast

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure