Inspection system and method

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250578, 356435, G01N 2132

Patent

active

041711580

ABSTRACT:
An electronic system for detecting faults or flaws in individual items of a stream of items has a single row of light sensors and a light source and detects the presence of an item between source and detectors, establishes a reference level for comparison that is a function of the individual item under inspection, and produces a fault signal from any individual sensor having a change in incident light that is a predetermined amount greater than the reference level and which occurs within a predetermined adjustable portion of the item passing the sensors.

REFERENCES:
patent: 3005548 (1961-10-01), Flanders et al.
patent: 3818223 (1974-06-01), Gibson et al.
patent: 3835332 (1974-09-01), Bridges
patent: 4025422 (1977-05-01), Malvick et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Inspection system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Inspection system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inspection system and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-803428

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.