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Apparatus for testing the base-folding of bases formed on tube s

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Apparatus for the detection of contaminants in an elongated text

Optics: measuring and testing – Inspection of flaws or impurities – Textile inspection
Patent

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Apparatus for the detection of surface defects

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Apparatus for the inspection of translucent containers

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Patent

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Apparatus for the inspection of tubular textile products

Optics: measuring and testing – Inspection of flaws or impurities – Textile inspection
Patent

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Apparatus for the optical detection of flaws, in particular crac

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent

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Apparatus for the optical inspection of the thermal...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Apparatus for wafer inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Apparatus for, and methods of, determining the characteristics o

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Apparatus of inspecting defect in semiconductor and method...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Apparatus, method and system for inspecting a fastener

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Apparatus, method, and computer program for wafer inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Apparatus, system and method for checking film for defects

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate

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Appearance inspecting jig for small parts and inspecting...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Appearance inspection apparatus and method of image...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Appearance inspection apparatus and the method of inspecting...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Appearance inspection machine for flat tablet

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Appearance inspection method and apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Arc illumination apparatus and method

Optics: measuring and testing – Inspection of flaws or impurities
Patent

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Arrangement and method for inspecting unpatterned wafers

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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