Appearance inspection apparatus and the method of inspecting...

Details Appearance inspection apparatus and the method of inspecting... Appearance inspection apparatus and the method of inspecting...

2006-02-21

2006-02-21

Stafira, Michael P. (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

Surface condition

Reexamination Certificate

active

07002676

ABSTRACT:
An appearance inspection apparatus and method using at least one telecentric lens, although at least two is preferred and at least a corresponding number of line sensors arranged in parallel with the image capture direction for inspecting a large circuit board. When two lenses are used two images are formed, which partially overlap each other. If image data for one line is captured in this state, a scanning head having two sets of telecentric optical systems move one line at a time in the driving direction. By repeating the same steps, data for two image segments which partially overlap throughout the entire line of board are obtained. The two image segments are synthesized after displacement of positions when colors in the overlapping portion of the two pieces of images are corrected. Inspection of board is then performed based on the combined image.

REFERENCES:
patent: 5197105 (1993-03-01), Uemura et al.
patent: 6211899 (2001-04-01), Yoshida
patent: 6424735 (2002-07-01), Freifeld
patent: 6437312 (2002-08-01), Adler et al.
patent: 6552783 (2003-04-01), Schmidt et al.
patent: 6560024 (2003-05-01), Akiyama et al.
patent: 2004/0012775 (2004-01-01), Kinney et al.

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