Optics: measuring and testing – Inspection of flaws or impurities
Patent
1999-04-07
2000-09-12
Font, Frank G.
Optics: measuring and testing
Inspection of flaws or impurities
356375, 25055934, 2505594, 25055946, 348 87, 348126, 348131, 382146, G01N 2100, G01B 1114, H04N 718, H04N 947
Patent
active
061185248
ABSTRACT:
An illumination apparatus and method illuminates one or more reflective elements, such as solder balls on an electronic component or other protruding surfaces or objects. The illumination apparatus includes one or more arc shaped or arc shape arranged light sources that provides a substantially even illumination across the one or more reflective elements. An illumination detection device detects light beams reflecting off of the illuminated reflective elements for forming a reflected image. A method of processing the reflected image includes locating one or more points on each reflected image element representing an illuminated reflective element. The points on the reflected image elements are used to located the pattern of the reflected image elements and/or to fit an outline around each image element corresponding to a known percentage of the true dimensions of each solder ball or other reflective element. The inspection system and method thereby determines various characteristics such as the absence/presence, location, pitch, size and shape of each reflective element.
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King Steven Joseph
Ludlow Jonathan Edmund
Acuity Imaging, LLC
Font Frank G.
Merlino Amanda
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