Appearance inspection apparatus and method of image...

Details Appearance inspection apparatus and method of image... Appearance inspection apparatus and method of image...

2007-05-22

2007-05-22

Nguyen, Sang H. (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

C356S237300, C359S619000

Reexamination Certificate

active

10764098

ABSTRACT:
The present invention is an appearance inspection apparatus and method utilizing multiple light sources in a lighting unit30to alternately irradiate, line by line, side light from a side light source and slit light from a slit light source onto board1to be inspected. A correction value memory unit stores digital correction values required for correcting shadings for the side light source and the slit light source and an analysis unit utilizes these digital correction values to correct shadings on the image data. A highly accurate image is thus obtained.

REFERENCES:
patent: 4947666 (1990-08-01), Hametner et al.
patent: 4978224 (1990-12-01), Kishimoto et al.
patent: 5130820 (1992-07-01), Hirota
patent: 5191441 (1993-03-01), Suzuki et al.
patent: 5197105 (1993-03-01), Uemura et al.
patent: 5880828 (1999-03-01), Nakamura et al.
patent: 5880859 (1999-03-01), Hiromatsu
patent: 6424735 (2002-07-01), Freifeld
patent: 6437312 (2002-08-01), Adler et al.
patent: 6552783 (2003-04-01), Schmidt et al.
patent: 6560024 (2003-05-01), Akiyama et al.
patent: 6678402 (2004-01-01), Jones et al.
patent: 7002676 (2006-02-01), Akiyama
patent: 2003/0031362 (2003-02-01), Keithley
patent: 09113361 (1997-05-01), None

Affiliated with

Also associated with

Rating

Appearance inspection apparatus and method of image... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Appearance inspection apparatus and method of image..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Appearance inspection apparatus and method of image... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3739440