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Adjustment of particle beam landing angle

Optics: measuring and testing – Focal position of light source
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Aperture variable inspection optical system and color filter...

Optics: measuring and testing – Focal position of light source
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Apparatus and method for calibrating reflective lens

Optics: measuring and testing – Focal position of light source
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Apparatus and method for measuring characteristics of optical pi

Optics: measuring and testing – Focal position of light source
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Apparatus for detecting a position of an optical pickup

Optics: measuring and testing – Focal position of light source
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Apparatus for testing lenses by determining best focus

Optics: measuring and testing – Focal position of light source
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Correction of optical metrology for focus offset

Optics: measuring and testing – Focal position of light source
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Defect compensation of lithography on non-planar surface

Optics: measuring and testing – Focal position of light source
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Determination of focal plane for a scanning projection aligner

Optics: measuring and testing – Focal position of light source
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Electrostatic device for correcting chromatic aberration in...

Optics: measuring and testing – Focal position of light source
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Focal point detection apparatus

Optics: measuring and testing – Focal position of light source
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Focus detection device

Optics: measuring and testing – Focal position of light source
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Focus error detector

Optics: measuring and testing – Focal position of light source
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Focusing device for optical system

Optics: measuring and testing – Focal position of light source
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Focusing for optical print heads

Optics: measuring and testing – Focal position of light source
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Headlamp focusing method

Optics: measuring and testing – Focal position of light source
Patent

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Lens testing system

Optics: measuring and testing – Focal position of light source
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Measuring apparatus

Optics: measuring and testing – Focal position of light source
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Measuring apparatus

Optics: measuring and testing – Focal position of light source
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Method and apparatus for activating semiconductor impurities

Optics: measuring and testing – Focal position of light source
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