Optics: measuring and testing – Focal position of light source
Reexamination Certificate
2007-08-29
2010-10-05
Toatley, Jr., Gregory J (Department: 2877)
Optics: measuring and testing
Focal position of light source
C356S432000
Reexamination Certificate
active
07808625
ABSTRACT:
Disclosed is an aperture variable inspection optical system including a variable aperture unit13having a polygonal light transparent section and light collecting systems12a,12bfor forming an irradiation spot U of light passing through the variable aperture unit13at the position of a sample S. The variable aperture unit13is capable of changing the shape/size of the polygon. The size of the irradiation spot U can be changed without rearranging the aperture unit.
REFERENCES:
patent: 4290698 (1981-09-01), Milana
patent: 5045296 (1991-09-01), Pfeffer et al.
patent: 5400135 (1995-03-01), Maeda
patent: 3-153506 (1991-07-01), None
patent: 6-18410 (1994-01-01), None
patent: 06-180425 (1994-06-01), None
patent: 11-264935 (1999-09-01), None
patent: 2000-121553 (2000-04-01), None
patent: P.364232 (2005-05-01), None
patent: 191356 (2006-05-01), None
Nakamura Kenji
Shiraiwa Hisashi
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Merlino Amanda H
Otsuka Electronics Co., Ltd.
Toatley Jr. Gregory J
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