Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1998-06-09
2000-05-16
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356398, 3562371, G01N 2100
Patent
active
060644834
ABSTRACT:
A device for detecting the position, coplanarity and separation of terminals of printed circuit board components wherein the terminals are consecutively imaged on a topically resolving detector through the use of an illuminating light source, and wherein the direct reflections are suppressed by the use of a polarized light source and by the existence of an optical analyzer in the imaging beam path, resulting in only the diffused reflections being used for imaging to avoid overradiation of the detector.
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patent: 5162866 (1992-11-01), Tomiya et al.
patent: 5208463 (1993-05-01), Honma et al.
patent: 5212390 (1993-05-01), LeBeau et al.
patent: 5440391 (1995-08-01), Smeyers et al.
patent: 5751910 (1998-05-01), Bryant et al.
Pham Hoa Q.
Siemens Aktiengesellschaft
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