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Method of and apparatus for determining surface contour of diffu

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Method of and device for measuring the refractive index of wafer

Optics: measuring and testing – By polarized light examination – With birefringent element
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Method of constructing a deviation angle self compensating...

Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate

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Method of examining an optical component

Optics: measuring and testing – By polarized light examination – With birefringent element
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Method of measuring orthogonality of stage unit

Optics: measuring and testing – By polarized light examination – With birefringent element
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Method of position detection and the method and apparatus of pri

Optics: measuring and testing – By polarized light examination – With birefringent element
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Mosaic quantification by birefringence measurement

Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate

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Multiple wavelength image plane interferometry

Optics: measuring and testing – By polarized light examination – With birefringent element
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Multiple wavelength linear zone plate alignment apparatus and me

Optics: measuring and testing – By polarized light examination – With birefringent element
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