Mosaic quantification by birefringence measurement

Details Mosaic quantification by birefringence measurement Mosaic quantification by birefringence measurement

2006-11-02

2009-12-01

Toatley, Jr., Gregory J (Department: 2877)

Optics: measuring and testing

By polarized light examination

With birefringent element

C356S030000, C356S432000

Reexamination Certificate

active

07626700

ABSTRACT:
A crystal optical material is illuminated at a wavelength of light that does not ionize the crystal optical material. Birefringence is measured between a plurality of voxels within the crystal optical material having spatial dimensions small enough to distinguish optical propagations of the light encountering boundary regions between subgrains of the crystal mosaic from optical propagations of the light through the subgrains themselves. The measured birefringence is evaluated for quantifying a characteristic of the crystal matrix. Metrics describing the crystal matrix are associated with performance of the crystal optical material.

REFERENCES:
patent: 4133309 (1979-01-01), Kohler et al.
patent: 6782075 (2004-08-01), Pell
B. C. CullityElements of X-Ray DiffractionAddison-Wesley Series In Metallurgy and Materials. pp. 100-101.

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