Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate
2011-03-15
2011-03-15
Lauchman, L. G. (Department: 2877)
Optics: measuring and testing
By polarized light examination
With birefringent element
C356S369000, C359S494010
Reexamination Certificate
active
07907280
ABSTRACT:
A method of configuring a system for introducing a relative phase retardation into orthogonally polarized components of an electromagnetic beam entered thereinto, wherein the system involves a substantially achromatic multiple element retarder system for use in wide spectral range (for example, 190-1700 nm) rotating compensator spectroscopic ellipsometer and/or polarimeter systems.
REFERENCES:
patent: 7233396 (2007-06-01), Hall et al.
patent: 7298480 (2007-11-01), Garcia-Caurel et al.
patent: 7450231 (2008-11-01), Johs et al.
patent: 7460230 (2008-12-01), Johs et al.
Green Steven E.
Herzinger Craig M.
Johs Blaine D.
Liphardt Martin M.
Meyer Duane E.
J.A. Woollam Co. Inc.
Lauchman L. G.
Welch James D.
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