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System, and mathematical regression-based method utilizing optic

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Systems and methods for measurement of a specimen with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Systems and methods for measurement of a specimen with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Systems and methods for measurement of a specimen with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Systems for measuring periodic structures

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Testing method for a polarizing plate

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Thickness measuring apparatus, substrate processing method,...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Thin film optical measurement system and method with calibrating

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Thin film optical measurement system and method with calibrating

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Thin film optical measurement system and method with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Thin film optical measurement system and method with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Thin film optical measurement system and method with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Thin film optical measurement system and method with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Thin film optical measurement system and method with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Thin film optical measurement system and method with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Thin-film characteristic measuring method using...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Time efficient method for investigating sample systems with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Total internal reflection electromagnetic radiation beam entry t

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Two modulator generalized ellipsometer for complete mueller matr

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Ultra-fast photometric instrument

Optics: measuring and testing – By polarized light examination – Of surface reflection
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