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Plano convex fluid carrier for scattering correction

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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Plasma constituent analysis by interferometric techniques

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Polarization insensitive absolute interferometeric method and ap

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Polarization interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Polarization interferometer apparatus using the polarization dep

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Polarization switching lidar device and method

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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Position detecting method and device therefor as well as alignin

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Position detection apparatus

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Position detection apparatus

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Position detector for detecting the position of an object using

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Position encoding holographic spectrometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Process and apparatus for absolute interferometric measurement o

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Process and apparatus for continuous determination of the states

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Process for characterizing suspensions of small particles

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Process for detection of sub-micron particulate contamination on

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Process for measuring the inclination of boundary areas in an op

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Process for the simultaneous detection of several gases in a gas

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Pulsed light source spectrometer with interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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