Process and apparatus for absolute interferometric measurement o

Optics: measuring and testing – By particle light scattering – With photocell detection

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356351, 356352, 356358, G01B 902

Patent

active

053330455

ABSTRACT:
A superluminescent source emits a wide-band light beam, that is frequency modulated by a filter with a pass band centred on a frequency that is made to vary according to a predetermined law so as to frequency modulate the light beam. Means for splitting and recombining beams determine a mutual phase shift between two components of the beam that depends on the physical magnitude to be measured and is detected by a detector as an indication of the value of the magnitude itself.

REFERENCES:
patent: 4886363 (1989-12-01), Jungquist
patent: 4890922 (1990-01-01), Wilson
patent: 4972077 (1990-11-01), Willson et al.
"Monomode Optical Fiber Interferometers", Jackson, Journal of Physics E. Scientific Instruments, 1985, pp. 985-987.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process and apparatus for absolute interferometric measurement o does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process and apparatus for absolute interferometric measurement o, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process and apparatus for absolute interferometric measurement o will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1055647

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.