Polarization insensitive absolute interferometeric method and ap

Details Polarization insensitive absolute interferometeric method and ap Polarization insensitive absolute interferometeric method and ap

1990-03-16

1992-04-21

Turner, Samuel A.

Optics: measuring and testing

By particle light scattering

With photocell detection

356358, 356363, G01B 902

Patent

active

051061929

ABSTRACT:
A method and apparatus for locating objects within a large range and with high accuracy through the use of a multiwave technique utilizing simultaneous phase measurements of interfering reflected and non-reflected optical radiation, comprising a plurality of different wavelengths and associated reference signals wherein the interfering reflected and non-reflected optical radiation create various heterodyne signals each having the same frequency as the associated reference signal.

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patent: 4907886 (1990-03-01), Dandliker
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