Position encoding holographic spectrometer

Details Position encoding holographic spectrometer Position encoding holographic spectrometer

1987-12-22

1989-05-30

Willis, Davis L.

Optics: measuring and testing

By particle light scattering

With photocell detection

356353, 356363, G01B 902

Patent

active

048345377

ABSTRACT:
An interferometric spectrometer (20) for determining two-dimensional positional and spectral information of two-dimensional light sources (26) is disclosed. The spectrometer (20) includes a mechanism (28) for splitting a beam source (24) into two beam components (30) and (32). A mechanism (34) and (36) for focusing and centering the pair of beam components (30) and (32) is positioned in the line of projection of the beam components (30) and (32). A mechanism (38) and (40) for reflecting the pair of beam components (30) and (32) is positioned in the line of projection of the two beam components (30) and (32). A detector mechanism (42) for detecting the beam components (30) and (32) is positioned in the line of projection of the two beam components (30) and (32). A mechanism (44) for determining spatial and spectral information of the source (26) is associated with the detector mechanism (42 ). Also disclosed is a method of determining spatial and spectral information of a light source utilizing the spectrometer.

REFERENCES:
Chakrabarti et al., "A New Inverted Shear Interferometer" J. Opt. (India), vol. 5, No. 4, pp. 80-87, 12/76.
Ballard, "Detecting Laser Illumination for Military Countermeasures", Laser Focus, pp. 72, 74, 76, 78, 80, 4/81.

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