Polarization interferometer apparatus using the polarization dep

Details Polarization interferometer apparatus using the polarization dep Polarization interferometer apparatus using the polarization dep

1997-08-01

1998-11-24

Turner, Samuel A.

Optics: measuring and testing

By particle light scattering

With photocell detection

356351, G01B 902

Patent

active

058415360

ABSTRACT:
An inexpensive and accurate wavemeter for measuring the wavelength of monochromatic light is described. The device uses the wavelength dependent phase lag between principal polarization states of a length of birefringent material (retarder) as the basis for measuring the optical wavelength. The retarder is sandwiched between a polarizer and a polarizing beamsplitter and is oriented such that its principal axes are non-orthogonal to the axis of the polarizer and the principal axes of the beamsplitter. As a result of the disparity in propagation velocities between the principal polarization states of the retarder, the ratio of the optical power exiting the two ports of the polarizing beamsplitter is wavelength dependent. If the input wavelength is known to be within a specified range, the measurement of the power ratio uniquely determines the input wavelength. The device offers the advantage of trading wavelength coverage for increased resolution simply through the choice of the retarder length. Implementations of the device employing both bulk-optic components and fiber-optic components are described.

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J.C. Braasch, W. Holzapfel, and S. Holzapfel, and S. Neuschaefer-Rube, "Wavelength Determination of Semiconductor Lasers: Precise but Inexpensive," Optical Engineering, vol. 34, pp. 1417-1420, 1995.

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