Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1987-04-24
1988-03-22
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
356351, G01B 902
Patent
active
047324813
ABSTRACT:
A polarization interferometer includes a light source to be measured, a Wollaston prism, a pair of polarizers arranged in such a manner that the Wollaston prism is interposed between the polarizers and the plane of polarization of each polarizer is inclined at 45.degree. to each of two crystallographic axes of the Wollaston prism, a photodetector for detecting an interference fringe which is spatially formed by two light beams separated by the Wollaston prism, changeover means for causing one of the polarizers to changeover from one of polarizing and non-polarizing states to the other state, memory means for storing a first output signal which is delivered from the photodetector in a state that one polarizer is kept at the non-polarizing state, and means for dividing a second output signal which is delivered from the photodetector in a state that one polarizer is kept at the polarizing state, by the first output signal stored in the memory means.
REFERENCES:
patent: 4072422 (1978-02-01), Tanaka et al.
patent: 4320973 (1982-03-01), Fortunato et al.
Balasubramanian et al., "A New Approach to High Precision Phase Measurement Interferometry", Proc. SPIE, vol. 230, pp. 180-190, 1980.
Inoue Masaru
Matsui Shigeru
Hitachi , Ltd.
Koren Matthew W.
Willis Davis L.
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