LandOfFree - US Patents - Listing for Optics: measuring and testing,By light interference

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Scanning interferometry for thin film thickness and surface...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Scanning interferometry with reference signal

Optics: measuring and testing – By light interference – For dimensional measurement

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Scanning IR microscope

Optics: measuring and testing – By light interference – Spectroscopy

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Scanning microscope

Optics: measuring and testing – By light interference – For dimensional measurement

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Scanning ultrasound detection device using two-wave mixing...

Optics: measuring and testing – By light interference – For dimensional measurement

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Scanning wide-area surface shape analyzer

Optics: measuring and testing – By light interference – For dimensional measurement

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Scanning, self-referencing interferometer

Optics: measuring and testing – By light interference – For dimensional measurement

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Scanning, self-referencing interferometer

Optics: measuring and testing – By light interference – For dimensional measurement

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Scattered light measuring device

Optics: measuring and testing – By light interference – Having light beams of different frequencies

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Scatterometry by phase sensitive reflectometer

Optics: measuring and testing – By light interference – Spectroscopy

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Scatterometry by phase sensitive reflectometer

Optics: measuring and testing – By light interference – Spectroscopy

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Self compensating cube corner interferometer

Optics: measuring and testing – By light interference

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Self referencing heterodyne reflectometer and method for...

Optics: measuring and testing – By light interference – Having light beams of different frequencies

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Self referencing mark independent alignment sensor

Optics: measuring and testing – By light interference – For dimensional measurement

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Self referencing mark independent alignment sensor

Optics: measuring and testing – By light interference – For dimensional measurement

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Self-calibrating measuring setup for interference spectroscopy

Optics: measuring and testing – By light interference – Spectroscopy

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Semiconductor die analysis as a function of optical...

Optics: measuring and testing – By light interference – For dimensional measurement

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Semiconductor fabricating apparatus with function of...

Optics: measuring and testing – By light interference – For dimensional measurement

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Semiconductor fabricating apparatus with function of...

Optics: measuring and testing – By light interference – For dimensional measurement

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Semiconductor laser gyro with modulated driving power source

Optics: measuring and testing – By light interference – Rotation rate

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