Optics: measuring and testing – By light interference
Reexamination Certificate
2006-11-06
2009-12-15
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By light interference
Reexamination Certificate
active
07633624
ABSTRACT:
A Michelson interferometer has transversely arranged arms defining first and second transverse optical axes of the interferometer. The interferometer includes a beamsplitter for receiving an incoming ray, and transmitting an output ray. The beamsplitter is configured as an optical wedge. The first optical axis is terminated by a first cube corner retro-reflector, and the second optical axis is terminated by a second cube corner retro-reflector. The first and second cube corner retro-reflectors provide self compensation for chromatic aberration and anamorphism between the incoming ray and the output ray, and the transversely arranged arms are free-of any compensator.
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patent: 5847828 (1998-12-01), Downs
patent: 6747741 (2004-06-01), Kleinschmidt
patent: 2004/0021872 (2004-02-01), Sandercock
Chowdhury Tarifur
ITT Manufacturing Enterprises Inc.
Lapage Michael
RatnerPrestia
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