Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate
2011-03-15
2011-03-15
Connolly, Patrick J (Department: 2877)
Optics: measuring and testing
By light interference
Having light beams of different frequencies
C356S073100
Reexamination Certificate
active
07907285
ABSTRACT:
Measurement of Brillouin scattered light is enabled without an optical receiver having a wide reception band. A scattered light measuring device includes a continuous wave light source that generates continuous wave light, an optical pulse generator that converts the continuous wave light into pulsed light, an optical frequency shifter that receives the continuous wave light, and outputs shifted light including the continuous wave light, first sideband light having an optical frequency higher than an optical frequency F0of the continuous wave light by a predetermined optical frequency Flo, and second sideband light having an optical frequency lower than the optical frequency F0of the continuous wave light by the predetermined optical frequency Flo, a power reducing unit that reduces the power of the continuous wave light in the shifted light output by said optical frequency shifter, and a heterodyne optical receiver that receives scattered light from an incident end of an optical fiber which the pulsed light enters, further receives the shifted light from said optical frequency shifter, and outputs an electric signal having a frequency which is a difference between the optical frequency of the scattered light and the optical frequency of the shifted light.
REFERENCES:
patent: 4794249 (1988-12-01), Beckmann et al.
patent: 5598289 (1997-01-01), Watanabe
patent: 5798853 (1998-08-01), Watanabe
patent: 6700655 (2004-03-01), Uchiyama et al.
patent: 2007/0159621 (2007-07-01), Ukita
patent: 2007/0171401 (2007-07-01), Ukita
patent: 2009/0273775 (2009-11-01), Ukira et al.
patent: 2010/0165327 (2010-07-01), Hartog
patent: 2-166426 (1990-06-01), None
patent: 7-11649 (1995-02-01), None
patent: 09-229820 (1997-09-01), None
patent: 9-229820 (1997-09-01), None
patent: 2001-165808 (2001-06-01), None
patent: 2002-323407 (2002-11-01), None
patent: 2003-139651 (2003-05-01), None
English language Abstract of JP 2002-323407.
English language Abstract of JP 9-229820.
English language Abstract of JP 2003-139651.
English language Abstract of JP 2-166426.
English language Abstract of JP 2001-165808.
Matsumura Takashi
Ukita Junichi
Advantest Corporation
Connolly Patrick J
Greenblum & Bernstein P.L.C.
LandOfFree
Scattered light measuring device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Scattered light measuring device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scattered light measuring device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2647604