Scanning IR microscope

Details Scanning IR microscope Scanning IR microscope

2006-06-06

2006-06-06

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

By light interference

Spectroscopy

Reexamination Certificate

active

07057733

ABSTRACT:
An FT-IR microscope is operated in association with a scanning spectrometer in such a way that incremental movement of the movable stage of the microscope is synchronized with the scans of the scanning spectrometer. This minimizes delays in processing time.

REFERENCES:
patent: 5945674 (1999-08-01), Dukor
patent: 6006140 (1999-12-01), Carter
patent: 1 184 703 (2002-03-01), None

Affiliated with

Also associated with

Rating

Scanning IR microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scanning IR microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning IR microscope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3641289