LandOfFree - US Patents - Listing for Optics: measuring and testing,By light interference

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Enhanced optical coherence tomography for anatomical mapping

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer

Reexamination Certificate

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Enhanced optical coherence tomography for anatomical mapping

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer

Reexamination Certificate

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Enhanced scale factor ring laser gyroscope

Optics: measuring and testing – By light interference – Rotation rate

Reexamination Certificate

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Enhanced sensitivity vibrometer

Optics: measuring and testing – By light interference – Having light beams of different frequencies

Reexamination Certificate

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Entangled photon fourier transform spectroscopy

Optics: measuring and testing – By light interference – Spectroscopy

Reexamination Certificate

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Equal-path interferometer

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Error compensation in phase shifting interferometry

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Error correction in interferometry systems

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Etalon testing system and process

Optics: measuring and testing – By light interference – Having partially reflecting plates in series

Reexamination Certificate

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Exposure apparatus

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Exposure apparatus

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Exposure apparatus and device manufacturing method

Optics: measuring and testing – By light interference – For dimensional measurement

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Exposure apparatus and device manufacturing method including...

Optics: measuring and testing – By light interference – For dimensional measurement

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Exposure apparatus and device production method in which...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Exposure apparatus and exposure method

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Exposure apparatus and exposure method

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Exposure apparatus and method

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Exposure apparatus configured to minimize effects of...

Optics: measuring and testing – By light interference – For dimensional measurement

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Exposure apparatus for manufacturing semiconductor device,...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Exposure apparatus including interferometer system

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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