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Electrostatic path length control transducer

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Ellipsometer

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Emission microscope and method for continuous wavelength spectro

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Enchancing path length resets in a ring laser gyro

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Encoder for forming interference fringes by re-diffracted lights

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Encoder spectrograph for analyzing radiation using spatial...

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate

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Encoder utilizing interference using multi-mode semiconductor la

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Encoding apparatus for making measurements of two-dimensional di

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Endless fiber interferometer rotary motion sensor

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Endpoint detection for semiconductor processes

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Endpoint detector and method for measuring a change in wafer thi

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Endpoint detector and method for measuring a change in wafer thi

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Environmental parameter measurement device and method for laser

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Environmentally independent fiber optic rotation sensor

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Equal path, phase shifting, sample point interferometer for moni

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Error cancelling bias system

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Etch rate monitor using collimated light and method of using sam

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Evaluating system for a dual focus lens

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Evaluation apparatus and evaluation method

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate

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Evanescent wave downhole fiber optic spectrometer

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate

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