Equal path, phase shifting, sample point interferometer for moni

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer

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356360, 356363, G01B 902

Patent

active

050804901

ABSTRACT:
A system for monitoring the configuration of a surface (e.g., a segmented parabolic surface) using orthogonally placed retroreflectors at sets of points A, B and C dispersed throughout the surface with a stationary halfwave plate HWP in the front of the one retroreflector at a corner point C and a rotating halfwave plate RHWP over a source of linearly polarized coherent light, thereby causing the direction of linear polarization to continuously rotate through 360.degree. and causing light returned by the retroreflector at point C to be continuously phase shifted through 360.degree. relative to light returned by retroreflectors at points A and B. The returned light from each set of points A. B and C is focused onto a bed-of-nails (BON) phase grating diagonally oriented with respect to the orthogonal orientation of the incident beams from retroreflectors A, B and C, thereby causing overlap in the light from points A and C and from points B and C to produce interferometric signals AC and BC. Any change in phase of the interferometric signals AC and BC indicates both the magnitude and direction of any change in the position of the retroreflector at point C relative to retroreflectors at points A and B.

REFERENCES:
patent: 4022532 (1972-05-01), Montagnino
patent: 4883357 (1989-11-01), Zanoni et al.
patent: 4958931 (1990-09-01), Tatian
Roland Shack, Final Report, Task 1, "A Simple Tilt and/or Phase Sensor," Univeristy of Arizona.
G. Chanan, et al., "Keck Telescope Primary Mirror Segments: Initial Alignment and Active Control," Keck Observatory Report No. 171, Apr. 1988.
J. Nelson, et al., "Aberration Correction in a Telescope with a Segmented Primary," Keck Observatory Report No. 180 (also published in SPIE Proceedings on Active Telescope Systems, vol. 1114, Orlando, FL Mar. 1989).

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